Binder is offering a range of five- and eight-pin circular connectors that protect against dust, dirt and moisture, even when ...
Abstract: Power cycling test (PCT) is a crucial method for evaluating the long-term reliability of SiC metal–oxide–semiconductor field-effect transistors (MOSFETs). Existing studies on the degradation ...
Abstract: This paper presents a low-profile pin-loaded patch antenna array with 2-D wide-angle beam scanning capability. The radiation parts of the proposed array are designed on $20-\mathrm{mil}-$ ...
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