Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...
Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...
Striking out across the DesignCon Exhibit Hall in Santa Clara on February 2nd, I stopped at the LeCroy booth and spoke with Dan Monopoli, a Product Marketing Manager for the company in from Chestnut ...
Diagnostic test developers, including clinical laboratories, responded to the COVID-19 pandemic with inspiring creativity to meet patient testing needs. These developers found unique ways to enable ...
Even though the $11 million lab is brand new, word of the facility has circulated within the academic community. Purdue has been using it to attract top engineers – including the lab's new director – ...
Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...
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