Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Nuclear pore complexes are more dynamic than previously thought, reshaping our understanding of a vital transport process in cells. An international study led by the University of Basel (Switzerland) ...

AzoMaterials speaks to Cassandra Phillips and Qichi Hu from Bruker about how their new Resonance-Enhanced Force Volume AFM-IR technology overcomes the limitations of conventional nanoscale ...