A subject rarely found in circuit design textbooks is the matter of nonlinear junction capacitance, especially reverse-bias junction capacitance, also called depletion capacitance. When it is ...
A recently filed patent (Publication Number: US20230314495A1) describes a capacitance measurement circuit that includes an analog front-end circuit, a parasitic capacitor, an analog to digital ...
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
In Part 1 of the Electronics for Kids series, we looked at LEDs; in Part 2, we explored capacitors; and in Part 3, we took an in-depth look at electrical measurements. In this article, we will focus ...
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